On Demand Webinar
Using TOF-ICP-MS to scale the nanoparticle analyse mountain and reach the non-target analysis summit
The analysis of small particles down to tens and hundreds of nanometer sizes has been a challenging undertaking over the past decades. Whilst single particle (SP)-ICP-MS has been proven a successful technique, TOF-ICP-MS is now recognised as a game changer due its multi-elemental capability allowing for compositional analysis on individual particles and nontarget nanoparticle analyses of unknown samples.
While the capability to quickly acquire multiple elements simultaneously is a great advantage, the size of data files generated can reach gigabytes in a matter of a few minutes. The new challenge that we are faced with is how to handle and make sense of this data to obtain accurate results quickly in this new age of nanoparticle analysis.
This webinar will discuss nanoparticle detection using TOF-ICP-MS and the data analysis of detected particles presented by two speakers:
- Lukas Schlatt, Vitesse product manager from Nu Instruments will discuss how the Vitesse TOF-ICP-MS can address the challenges arising from nanoparticles analysis.
- David Clases, Assistant Professor at Karl-Franzens-Universität Graz will present some of their soon to be published data on using a pre-analysis tool to simplify data treatment of large files and the results that can be obtained. Hyphenated techniques for TOF-ICP-MS will also be discussed.
Vitesse TOF-ICP-MS
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